กล้องจุลทรรศน์แบบแสงตกกระทบสำหรับงานวัสดุและโลหะวิทยา (Metallurgical Upright Microscope) แบบไบรท์ฟิลด์ พร้อมด้วยชุดส่องสว่างรุ่น X-LED
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B-383MET |
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| Observation mode: Brightfield, incident polarized light. Epi-illumination and polarizing filters: X-LED3 with white 3.6 W LED (6.300 K) with brightness control. Field and aperture diaphragms, polarizer & analyzer filters. Head: Trinocular (fixed 50/50), 30° inclined, 360° rotating. Interpupillary distance: Adjustable between 48 and 75 mm. Dioptric adjustment: On the left eyepiece tube. Eyepieces: WF10x/20 mm, high eye-point and secured by screw. Nosepiece: Quintuple revolving nosepiece, rotation on ball bearings. Objectives (strain-free): IOS W-PLAN MET 4x/0.10 IOS W-PLAN MET 10x/0.25 IOS W-PLAN MET 20x/0.40 IOS W-PLAN MET 50x/0.75 All with anti-fungus treatment. Specimen stage: Double layer rackless mechanical stage, 233×147 mm, 78×54 mm X-Y range. With tempered glass plate. Focusing: Coaxial coarse (adjustable tension) and fine focusing mechanism with limit stop to prevent the contact between objective and specimen. Condenser: Abbe N.A. 1.25, with objective-coded iris diaphragm, focusable and centerable. Transmitted illumination (Fixed Koehler type): X-LED3 with white 3.6 W LED (6.300 K) with brightness control. Multi-plug 100-240Vac/6Vdc external power supply. |
| Related Literature : |
 OPTIKA – B-383MET – Technical Datasheet – EN – 252.60 KB |
